Capacitance Sensors Facilitate 3D IC Construction

Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting [...]

Adding a Digital Panel Meter to MTI Analog Output Products

Adding a Digital Panel Meter to MTI Analog Output Products Consumer Electronics Electronics Parts Profiling Thickness Description Some MTI Products with Analog outputs, Accumeasure 9000 and Microtrak 3 laser  How To Use Digital Displays with Analog Outputs MTI Microtrak 3 Lasers and some [...]

Thickness Gauge Measurement With Conductive Wafers and Thin Films

Thickness Gauge Measurement With Conductive Wafers and Thin Films Consumer Electronics Electronics Parts Profiling Thickness Description Using MTI's capacitive thickness gauge Proforma 300i with conductive wafers and thin films G = (a+b+t1+t2 ) Where G is the fixed gap between two probes When making [...]

Measuring Piezoelectric Properties with Fiber Optics

Measuring Piezoelectric Properties with Fiber Optics Research & Development Piezoceramic, 1-3 Pzt / Polymer Composite And Pvdf Film Amplitude Description Figure 4: Fiber Optic MTI 2100 Fotonic Sensor Introduction Researchers from the University of Arizona used the MTI-2000 Fotonic Sensor to measure the [...]

Semiconductor Wafer Lapping and Displacement Measurement

Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI's Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. [...]

led substrate sapphire thickness

N/A led substrate sapphire thickness Displacement Remember that old acronym, GIGO?  Garbage in garbage out, it can apply to raw materials as well as programming. Sapphire wafers need to be of a certain quality to ensure maximum yield. EXCESSIVE TTV, BOW, AND WARP LEAD TO PREMATURE LED FAILURE LED MANUFACTURERS [...]

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution Animation showing a system setup used to measure the thickness of thin conductive films such as electric vehicle (EV) battery electrodes. Description Learn how to measure EV battery plate thickness with MTI's Digital Accumeasure, a [...]

Vibration and Balancing Systems: The Spectrum Plot

Vibration and Balancing Systems: The Spectrum Plot Aviation / Aerospace Engine Balancing Vibration Description The Spectrum Plot: Types of Aircraft Vibration One of the least understood features of the PBS series of vibration analyzers is the spectrum function. The spectrum functionality is a more difficult [...]

Thickness Information of Composite Materials

Thickness Information of Composite Materials Industrial Thickness Information Of Composite Materials Thickness Description Introduction: Composite materials consist of two or more materials which include a substrate or base material such as paper, cotton cloth, or glass cloth along with a resin or adhesive such as [...]

Capacitance Probe Detects Water Contamination in Oiling Systems

Capacitance Probe Detects Water Contamination in Oiling Systems Industrial, Research & Development Capacitance Probe Detection of Water Contamination Metrology, Tolerances Description [Application Note 12218]  The adverse effects of water in oil are well known. Negative consequences include higher viscosity reduced load carrying ability hydrolysis (the [...]

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