Did You Know? GaGe Digitizers in Military & Aerospace Applications

Introduction High-speed digitizers are indispensable tools in the military and aerospace industries, revolutionizing the way data is captured, processed, and analyzed. These  advanced devices enable precise measurement and real-time monitoring of complex systems, from radar and communication systems to electronic warfare and  avionics. By converting analog signals into high-resolution digital data at unprecedented speeds, [...]

Common Test and Calibration Uses of the 1510A Portable Signal Generator

Introduction As one of the most versatile and powerful hand-held signal generators on the market, the 1510A is a two-channel, battery-powered, microprocessor-controlled direct digital signal generator. It has an average battery life of 3 hours of continuous use. Weighing in at under two pounds, makes it ideal for use in the field. [...]

2024-09-05T10:24:18-07:00

Case-In-Point: MTI Turbine Vibration Analyzer/Balancing System Technology Principles

What do you think when you’re flying home, cruising at 30,000 feet and the drinks have just been served? Our engineers think about the ripple in the glass. That ripple signals vibration and is an indication that the engine may be in need of a balance.

Article: High-Performance Digitizers in Semiconductor Manufacturing Applications

High-Performance Digitizers in Semiconductor Manufacturing Applications PC-based high-speed, high-resolution digitizers perform critical data acquisition functions during semiconductor fabrication, die packaging, and final chip testing. Introduction Data acquisition is a critical element of quality control and compliance testing during three stages of semiconductor manufacture. The first stage is fabrication, in which [...]

The Cost of Failing to Inspect Semiconductor Wafers

This is the second of three articles in Semiconductor Wafer Measurement for Increased Profitability. The first article in this series explains why disc geometry matters. The third article describes the benefits of using semi-automated, fully-automated, and manual systems for wafer metrology and inspection. Most semiconductor wafers are made of silicon, the second most common element in the Earth’s [...]

Signal Generator Simulates Eddy Current Probe

Signal Generator Simulates Eddy Current Probe Industrial, Power Generation, Automotive, Power Generation, R& D, Solar Simulation of Eddy Current Probe Gap, Amplitude, Displacement, Positioning, Thickness Description [Application Note 31218] Non-contact eddy current probes can be used to measure the position, or position change, of conductive [...]

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution

Closed Loop, Non-woven Conductive Film Thickness Measurement and Control Solution Animation showing a system setup used to measure the thickness of thin conductive films such as electric vehicle (EV) battery electrodes. Description Learn how to measure EV battery plate thickness with MTI's Digital Accumeasure, a [...]

Capacitance Sensors Facilitate 3D IC Construction

Capacitance Sensors Facilitate 3D IC Construction Semiconductor, Research & Development 3D IC Construction Distance, Positioning, Displacement Description [Application Note 70518] To boost device performance, today's semiconductor and microelectronics manufacturers are building three-dimensional integrated circuits featuring vertically-stacked silicon wafers and dies. The rationale is simple. Exploiting [...]

Vibration and Balancing Systems: The Spectrum Plot

Vibration and Balancing Systems: The Spectrum Plot Aviation / Aerospace Engine Balancing Vibration Description The Spectrum Plot: Types of Aircraft Vibration One of the least understood features of the PBS series of vibration analyzers is the spectrum function. The spectrum functionality is a more difficult [...]

Semiconductor Wafer Lapping and Displacement Measurement

Semiconductor Wafer Lapping and Displacement Measurement Semiconductor Semiconductor Wafer Manufacturing Displacement Description Semiconductor Wafer Lapping and Displacement Measurement This application note explains how MTI's Accumeasure technology was used with a lapping machine to measure displacement (wafer material removal) and determine the new semiconductor wafer thickness. [...]

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